发明授权
US08557608B2 Method for characterizing a local magnetic field, and device for carrying out the method
有权
用于表征局部磁场的方法,以及用于执行该方法的装置
- 专利标题: Method for characterizing a local magnetic field, and device for carrying out the method
- 专利标题(中): 用于表征局部磁场的方法,以及用于执行该方法的装置
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申请号: US11603034申请日: 2006-11-22
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公开(公告)号: US08557608B2公开(公告)日: 2013-10-15
- 发明人: Joachim Bangert
- 申请人: Joachim Bangert
- 申请人地址: DE Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DE Munich
- 代理机构: Harness, Dickey & Pierce P.L.C.
- 优先权: DE102005056249 20051125
- 主分类号: G01N33/553
- IPC分类号: G01N33/553 ; G01N27/00
摘要:
A method is disclosed for characterizing a local magnetic field, in particular a stray field caused by a magnetizable or magnetic particle in a prescribed measuring area of a magnetic field. In at least one embodiment, a sensor array including a number of magnetic sensors and each having at least one layer sensitive to magnetic fields is arranged at least in a subregion of the measuring area, and at least one device is provided for reading out separately the signal from each sensor. According to at least one embodiment, the size, in particular of XMR sensors and the surface of the layer sensitive to magnetic fields and the grid dimension of the sensor array, are selected such that at least two neighboring sensors are influenced by the local stray field. An associated device for carrying out the method is also disclosed.
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