发明授权
- 专利标题: Nonvolatile memory cell and method of manufacturing the same
- 专利标题(中): 非易失性存储单元及其制造方法
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申请号: US12838878申请日: 2010-07-19
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公开(公告)号: US08558295B2公开(公告)日: 2013-10-15
- 发明人: Sung Min Yoon , Chun Won Byun , Shin Hyuk Yang , Sang Hee Park , Soon Won Jung , Seung Youl Kang , Chi Sun Hwang , Byoung Gon Yu
- 申请人: Sung Min Yoon , Chun Won Byun , Shin Hyuk Yang , Sang Hee Park , Soon Won Jung , Seung Youl Kang , Chi Sun Hwang , Byoung Gon Yu
- 申请人地址: KR Daejeon
- 专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人地址: KR Daejeon
- 代理机构: Rabin & Berdo, P.C.
- 优先权: KR10-2009-0078459 20090825; KR10-2010-0029135 20100331
- 主分类号: H01G7/06
- IPC分类号: H01G7/06
摘要:
Provided are a nonvolatile memory cell and a method of manufacturing the same. The nonvolatile memory cell includes a memory transistor and a driver transistor. The memory transistor includes a semiconductor layer, a buffer layer, an organic ferroelectric layer, and a gate electrode, which are disposed on a substrate. The driver transistor includes the semiconductor layer, the buffer layer, a gate insulating layer, and the gate electrode, which are disposed on the substrate. The memory transistor and the driver transistor are disposed on the same substrate. The nonvolatile memory cell is transparent in a visible light region.
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