发明授权
- 专利标题： Methods and apparatus for selecting settings for circuits
- 专利标题（中）： 用于选择电路设置的方法和设备
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申请号： US12639187申请日： 2009-12-16
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公开(公告)号： US08558553B2公开(公告)日： 2013-10-15
- 发明人: Kenneth A. Ostrom , Richard Pierson , Benjamim Tang , Clark Custer , Scott Southwell , Felix Kim
- 申请人： Kenneth A. Ostrom , Richard Pierson , Benjamim Tang , Clark Custer , Scott Southwell , Felix Kim
- 申请人地址： AT Villach
- 专利权人： Infineon Technologies Austria AG
- 当前专利权人： Infineon Technologies Austria AG
- 当前专利权人地址： AT Villach
- 代理机构： Murphy, Bilak & Homiller, PLLC
- 主分类号： G01R31/02
- IPC分类号： G01R31/02
摘要：
Methods and apparatus selecting settings for circuits according to various aspects of the present invention may operate in conjunction with a measurement element connected to the circuit. The circuit may include a voltage source adapted to supply a voltage to the measurement element. The voltage may be substantially independent of the characteristics of the measurement element. The circuit may further include a measurement sensor responsive to a current in the measurement element. The measurement sensor may generate a control signal according to the current in the measurement element.
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