Invention Grant
- Patent Title: Capacitor power source tamper protection and reliability test
- Patent Title (中): 电容器电源篡改保护和可靠性测试
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Application No.: US13340439Application Date: 2011-12-29
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Publication No.: US08559262B2Publication Date: 2013-10-15
- Inventor: Srikanth Reddy Tiyyagura , David Still , Jayant Ashokkumar , David G Wright
- Applicant: Srikanth Reddy Tiyyagura , David Still , Jayant Ashokkumar , David G Wright
- Applicant Address: US CA San Jose
- Assignee: Cypress Semiconductor Corporation
- Current Assignee: Cypress Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: G11C5/14
- IPC: G11C5/14

Abstract:
A verification circuit for a capacitor power supply measures at least two voltages across the terminals of the capacitor at two points in time, the two points in time defining a time interval dT. A change in voltage dV over the time interval dT is determined. An operation powered by the capacitor is initiated, or not, by deriving from the time interval dT and/or the voltage change dV, a total required time or a total required voltage for completing the operation, and comparing the total required time or total required voltage to a pre-determined necessary total time or predetermined necessary total voltage, respectively (a “time interval test”).
Public/Granted literature
- US20130170312A1 CAPACITOR POWER SOURCE TAMPER PROTECTION AND RELIABILITY TEST Public/Granted day:2013-07-04
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