Invention Grant
- Patent Title: Optical inspection device, electromagnetic wave detection method, electromagnetic wave detection device, organism observation method, microscope, endoscope, and optical tomographic image generation device
- Patent Title (中): 光学检测装置,电磁波检测方法,电磁波检测装置,生物体观察法,显微镜,内窥镜和光学断层图像生成装置
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Application No.: US12678390Application Date: 2009-03-23
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Publication No.: US08565861B2Publication Date: 2013-10-22
- Inventor: Kenji Taira , Hiroyoshi Yajima , Shinichi Takimoto
- Applicant: Kenji Taira , Hiroyoshi Yajima , Shinichi Takimoto
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Priority: JP2008-120293 20080502; JP2008-120331 20080502; JP2009-051172 20090304
- International Application: PCT/JP2009/055654 WO 20090323
- International Announcement: WO2009/133734 WO 20091105
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
An optical inspection device 1, comprising a light generation means 2, a light irradiation means 3 irradiating an object to be inspected 4 with light generated from the light generation means 2 and a photodetection means 6 photoelectrically converting signal light obtained from the object to be inspected 4 through irradiation of light by the light irradiation means 3, and inspecting the object to be inspected 4 based on output from the photodetection means 6, wherein a light amplification means 5 amplifying signal light obtained from the object to be inspected 4 is provided. There is thus provided an optical inspection device capable of photoelectrically converting signal light from the object to be inspected with high sensitivity and promptly with its inexpensive configuration without increasing the intensity of light with which the object to be inspected is irradiated and without using an expensive low-noise and high-sensitivity photodetector.
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