发明授权
- 专利标题: Integrated circuit device and method of manufacturing the same
- 专利标题(中): 集成电路装置及其制造方法
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申请号: US13090606申请日: 2011-04-20
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公开(公告)号: US08575717B2公开(公告)日: 2013-11-05
- 发明人: Der-Chyang Yeh , Shang-Yun Hou
- 申请人: Der-Chyang Yeh , Shang-Yun Hou
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Haynes and Boone, LLP
- 主分类号: H01L29/86
- IPC分类号: H01L29/86
摘要:
Provided is a integrated circuit device and a method for fabricating the same. The integrated circuit device includes a semiconductor substrate having a dielectric layer disposed over the semiconductor substrate and a passive element disposed over the dielectric layer. The integrated circuit further includes an isolation matrix structure, underlying the passive element, wherein the isolation matrix structure includes a plurality of trench regions each being formed through the dielectric layer and extending into the semiconductor substrate, the plurality of trench regions further including an insulating material and a void area.
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