发明授权
- 专利标题: Smart edge detector
- 专利标题(中): 智能边缘检测器
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申请号: US13551331申请日: 2012-07-17
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公开(公告)号: US08575967B2公开(公告)日: 2013-11-05
- 发明人: Shu-Chun Yang , Jinn-Yeh Chien
- 申请人: Shu-Chun Yang , Jinn-Yeh Chien
- 申请人地址: TW
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW
- 代理机构: Lowe Hauptman & Ham, LLP
- 主分类号: H03K5/22
- IPC分类号: H03K5/22
摘要:
This description relates to an edge detector including a pulse generator configured to generate a first pulse when a first clock and a second clock are at a same logic level and generate a second pulse when the first clock and the second clock are at different logic levels. The edge detector further includes a first RC circuit configured to charge the first pulse and a second RC circuit configured to charge the second pulse. The edge detector further includes a circuitry that, based on a width of the first pulse or of the second pulse, is configured to provide a select signal to select an edge of the second clock for triggering.
公开/授权文献
- US20120280718A1 SMART EDGE DETECTOR 公开/授权日:2012-11-08
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