Invention Grant
US08580130B2 Laser-assisted nanomaterial deposition, nanomanufacturing, in situ monitoring and associated apparatus
有权
激光辅助纳米材料沉积,纳米制造,原位监测及相关设备
- Patent Title: Laser-assisted nanomaterial deposition, nanomanufacturing, in situ monitoring and associated apparatus
- Patent Title (中): 激光辅助纳米材料沉积,纳米制造,原位监测及相关设备
-
Application No.: US12743550Application Date: 2008-12-16
-
Publication No.: US08580130B2Publication Date: 2013-11-12
- Inventor: Samuel S. Mao , Costas P. Grigoropoulos , David J. Hwang , Andrew M. Minor
- Applicant: Samuel S. Mao , Costas P. Grigoropoulos , David J. Hwang , Andrew M. Minor
- Applicant Address: US CA Oakland
- Assignee: The Regents of the University of California
- Current Assignee: The Regents of the University of California
- Current Assignee Address: US CA Oakland
- Agency: Weaver Austin Villeneuve & Sampson LLP
- International Application: PCT/US2008/087027 WO 20081216
- International Announcement: WO2009/085772 WO 20090709
- Main IPC: B44C1/22
- IPC: B44C1/22

Abstract:
Laser-assisted apparatus and methods for performing nanoscale material processing, including nanodeposition of materials, can be controlled very precisely to yield both simple and complex structures with sizes less than 100 nm. Optical or thermal energy in the near field of a photon (laser) pulse is used to fabricate submicron and nanometer structures on a substrate. A wide variety of laser material processing techniques can be adapted for use including, subtractive (e.g., ablation, machining or chemical etching), additive (e.g., chemical vapor deposition, selective self-assembly), and modification (e.g., phase transformation, doping) processes. Additionally, the apparatus can be integrated into imaging instruments, such as SEM and TEM, to allow for real-time imaging of the material processing.
Public/Granted literature
- US20100320171A1 LASER-ASSISTED NANOMATERIAL DEPOSITION, NANOMANUFACTURING, IN SITU MONITORING AND ASSOCIATED APPARATUS Public/Granted day:2010-12-23
Information query