Invention Grant
- Patent Title: Automatic optical measurement system and method
- Patent Title (中): 自动光学测量系统及方法
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Application No.: US12739988Application Date: 2008-11-04
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Publication No.: US08582106B2Publication Date: 2013-11-12
- Inventor: Perry A. Palumbo , Brian Harmon
- Applicant: Perry A. Palumbo , Brian Harmon
- Applicant Address: US CO Loveland
- Assignee: Hach Company
- Current Assignee: Hach Company
- Current Assignee Address: US CO Loveland
- Agency: Ference & Associates LLC
- International Application: PCT/US2008/082349 WO 20081104
- International Announcement: WO2009/061729 WO 20090514
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An automatic optical measurement system (100) is provided. The measurement system (100) includes a sample vial (10) and an automatic optical measurement apparatus (90) configured to receive the sample vial (10). The automatic optical measurement apparatus (90) is configured to detect a presence of the sample vial (10) in the automatic optical measurement apparatus (90) and measure a light intensity of light substantially passing through the sample vial (10) if the sample vial (10) is present. The measured light intensity is related to sample material properties of a sample material within the sample vial (10).
Public/Granted literature
- US20100245827A1 AUTOMATIC OPTICAL MEASUREMENT SYSTEM AND METHOD Public/Granted day:2010-09-30
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