发明授权
- 专利标题: Simplified beam splitter for IR gas sensor
- 专利标题(中): 用于红外气体传感器的简化光束分离器
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申请号: US12565099申请日: 2009-09-23
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公开(公告)号: US08586930B2公开(公告)日: 2013-11-19
- 发明人: Heikki Haveri , Kurt Peter Weckstrom
- 申请人: Heikki Haveri , Kurt Peter Weckstrom
- 申请人地址: US NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Schenectady
- 代理机构: Global Patent Operation
- 代理商 Marc A. Vivenzio
- 优先权: EP08165473 20080930
- 主分类号: G01J5/02
- IPC分类号: G01J5/02
摘要:
A non-dispersive single beam detection assembly in an infrared gas analyzer. The detection assembly comprises radiation source(s) providing infrared radiation, a measuring chamber, and a physical beam splitter for dividing said radiation beam into a reflected beam portion and a transmitted beam portion, or for combining a reflected beam portion and a transmitted beam portion into said radiation beam. A measuring detector receives one beam portions, and a reference detector receives another beam portion. Alternatively a measuring/reference detector receives both beam portions. Said transmitted beam portion has a first spectral intensity peak at shorter wavelengths with a first peak wavelength, and said reflected beam portion has a second spectral intensity peak at longer wavelengths with a second peak wavelength. There is a wavelength gap between said second peak wavelength and said first peak wavelength, which gap corresponds a wavelength shift of an optical interference filter with said second peak wavelength as tilted from its perpendicular position to an angled position. Said wavelength gap is at maximum 10% of the second peak wavelength, and at minimum 0.5% of the second peak wavelength.
公开/授权文献
- US20100078563A1 SIMPLIFIED BEAM SPLITTER FOR IR GAS SENSOR 公开/授权日:2010-04-01