发明授权
- 专利标题： Semiconductor integrated circuit device and oscillation frequency calibration method
- 专利标题（中）： 半导体集成电路器件和振荡频率校准方法
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申请号： US13294086申请日： 2011-11-10
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公开(公告)号： US08587384B2公开(公告)日： 2013-11-19
- 发明人: Yuji Satoh , Mototsugu Hamada , Daisuke Miyashita
- 申请人： Yuji Satoh , Mototsugu Hamada , Daisuke Miyashita
- 申请人地址： JP Tokyo
- 专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人地址： JP Tokyo
- 代理机构： Knobbe, Martens, Olson & Bear LLP
- 优先权： JP2010-015676 20100127
- 主分类号： H03L1/02
- IPC分类号： H03L1/02 ; H03B5/12
摘要：
A semiconductor integrated circuit device includes a DCO and a storing unit that stores a temperature coefficient of an oscillation frequency and an absolute value of the oscillation frequency, which should be set in the DCO, corresponding to potential obtained from a voltage source that changes with a monotonic characteristic with respect to temperature.
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