发明授权
- 专利标题: X-ray imaging apparatus and X-ray imaging method
- 专利标题(中): X射线成像装置和X射线成像方法
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申请号: US13060739申请日: 2009-10-19
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公开(公告)号: US08588366B2公开(公告)日: 2013-11-19
- 发明人: Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda , Masatoshi Watanabe
- 申请人: Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda , Masatoshi Watanabe
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2008-273859 20081024; JP2009-132096 20090601
- 国际申请: PCT/JP2009/068297 WO 20091019
- 国际公布: WO2010/047401 WO 20100429
- 主分类号: G01N23/04
- IPC分类号: G01N23/04
摘要:
An X-ray imaging apparatus for obtaining information on a phase shift of an X-ray caused by an object comprises: an splitting element for splitting spatially an X-ray emitted from an X-ray generator unit into X-ray beams; an attenuator unit having an arrangement of attenuating elements for receiving the X-ray beams split by the splitting element; and an intensity detector unit for detecting intensities of X-ray beams attenuated by the attenuator unit; and the attenuating element changing continuously the transmission amount of the X-ray depending on the X-ray incident position on the element.
公开/授权文献
- US20110158389A1 X-RAY IMAGING APPARATUS AND X-RAY IMAGING METHOD 公开/授权日:2011-06-30
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