发明授权
- 专利标题: Method of fabricating avalanche photodiode
- 专利标题(中): 制造雪崩光电二极管的方法
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申请号: US13273257申请日: 2011-10-14
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公开(公告)号: US08592247B2公开(公告)日: 2013-11-26
- 发明人: Jae Sik Sim , Ki Soo Kim , Bong Ki Mheen , Myoung Sook Oh , Yong Hwan Kwon , Eun Soo Nam
- 申请人: Jae Sik Sim , Ki Soo Kim , Bong Ki Mheen , Myoung Sook Oh , Yong Hwan Kwon , Eun Soo Nam
- 申请人地址: KR Daejeon
- 专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人地址: KR Daejeon
- 代理机构: Rabin & Berdo, P.C.
- 优先权: KR10-2010-0130537 20101220
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
A method includes: forming an epitaxy wafer by growing a light absorbing layer, a grading layer, an electric field buffer layer, and an amplifying layer on the front surface of a substrate in sequence; forming a diffusion control layer on the amplifying layer; forming a protective layer for protecting the diffusion control layer on the diffusion control layer; forming an etching part by etching from the protective layer to a predetermined depth of the amplifying layer; forming a first patterning part by patterning the protective layer; forming a junction region and a guardring region at the amplifying layer by diffusing a diffusion material to the etching part and the first patterning part; removing the diffusion control layer and the protective layer and forming a first electrode connected to the junction region on the amplifying layer; and forming a second electrode on the rear surface of the substrate.
公开/授权文献
- US20120156826A1 METHOD OF FABRICATING AVALANCHE PHOTODIODE 公开/授权日:2012-06-21
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