Invention Grant
US08595706B2 Control chart technique for analyzing software engineering activities affected by intrinsic process variation and statistical fluctuations 失效
控制图技术,用于分析受内在过程变化和统计波动影响的软件工程活动

  • Patent Title: Control chart technique for analyzing software engineering activities affected by intrinsic process variation and statistical fluctuations
  • Patent Title (中): 控制图技术,用于分析受内在过程变化和统计波动影响的软件工程活动
  • Application No.: US12172476
    Application Date: 2008-07-14
  • Publication No.: US08595706B2
    Publication Date: 2013-11-26
  • Inventor: Peter LouisKatrin Sulzbacher
  • Applicant: Peter LouisKatrin Sulzbacher
  • Applicant Address: DE München
  • Assignee: Siemens Aktiengesellschaft
  • Current Assignee: Siemens Aktiengesellschaft
  • Current Assignee Address: DE München
  • Main IPC: G06F9/44
  • IPC: G06F9/44
Control chart technique for analyzing software engineering activities affected by intrinsic process variation and statistical fluctuations
Abstract:
In software engineering, the performance or efficiency of individual process steps is typically defined as some sort of rate such as the number of detected defects divided by the effort spent for review or testing. In this situation, the variation in the data always reflects a mixture of intrinsic process variation caused by, for example, human factors such as the experience of reviewers or the variable quality of the review objects, and purely statistical variation due to the effects of Poisson statistics when defects are counted. Due to this mixture of causes of variation no conventional statistical process control chart holds for the constraints of typical software engineering processes. A new statistical process control (SPC) approach (method and system) is presented to overcome the mentioned problems.
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