发明授权
- 专利标题: Manufacturing apparatus and method for semiconductor device
- 专利标题(中): 半导体器件的制造装置和方法
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申请号: US13350102申请日: 2012-01-13
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公开(公告)号: US08597429B2公开(公告)日: 2013-12-03
- 发明人: Kunihiko Suzuki , Hironobu Hirata
- 申请人: Kunihiko Suzuki , Hironobu Hirata
- 申请人地址: JP Shizuoka-ken
- 专利权人: NuFlare Technology, Inc.
- 当前专利权人: NuFlare Technology, Inc.
- 当前专利权人地址: JP Shizuoka-ken
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权: JP2011-007736 20110118
- 主分类号: C23C16/00
- IPC分类号: C23C16/00 ; H01L21/31
摘要:
Provided is a semiconductor manufacturing apparatus including: a reaction chamber including a gas supply inlet and a gas exhaust outlet, and into which a wafer is to be introduced; a process gas supply mechanism that supplies process gas into the reaction chamber from the gas supply inlet of the reaction chamber; a wafer retaining member that is arranged in the reaction chamber and that retains the wafer; a heater that heats the wafer retained by the wafer retaining member to a predetermined temperature; a rotation drive control mechanism that rotates the wafer retaining member together with the wafer; a gas exhaustion mechanism that exhausts gas in the reaction chamber from the gas exhaust outlet of the reaction chamber; and a drain that is disposed at a bottom portion near a wall surface in the reaction chamber and that collects and discharges oily silane that drips from the wall surface.
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