发明授权
- 专利标题: Process for producing two interleaved patterns on a substrate
- 专利标题(中): 在衬底上产生两个交错图案的工艺
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申请号: US13187784申请日: 2011-07-21
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公开(公告)号: US08598038B2公开(公告)日: 2013-12-03
- 发明人: Yves Morand , Thierry Poiroux
- 申请人: Yves Morand , Thierry Poiroux
- 代理机构: Gardere Wynne Sewell LLP
- 优先权: FR1055979 20100722
- 主分类号: H01L21/311
- IPC分类号: H01L21/311
摘要:
A process for producing two interleaved patterns on a substrate uses photolithography and etching to produce, on the substrate, a first pattern of first material protruding regions separated by recessed regions. A non-conformal deposition of a second material on the first pattern forms cavities in the recessed regions of the first pattern. These cavities are opened and filled with a third material. The second material is then removed, and the remaining third material forms a second pattern of third material protruding regions, wherein the second pattern is interleaved with the first pattern.
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