Invention Grant
- Patent Title: Device matching tool and methods thereof
- Patent Title (中): 设备匹配工具及其方法
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Application No.: US13596337Application Date: 2012-08-28
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Publication No.: US08601430B1Publication Date: 2013-12-03
- Inventor: Mehul D. Shroff , Douglas M. Reber , Edward O. Travis
- Applicant: Mehul D. Shroff , Douglas M. Reber , Edward O. Travis
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method includes identifying at a first instantiation of a device design and a second instantiation of the device design, determining a first value of an electrical performance characteristic of the first instantiation and a second value of the electrical performance characteristic of the second instantiation, determining that the first instantiation matches the second instantiation, wherein the determining is based on the first value, the second value, and a tolerance, and in response to determining that the first and second instantiations do not match, then identifying a first feature of the first instantiation and changing the first feature of the first instantiation.
Public/Granted literature
- US2216344A Connector Public/Granted day:1940-10-01
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