发明授权
US08616821B2 Integrated apparatus to assure wafer quality and manufacturability 有权
集成设备,确保晶圆质量和可制造性

Integrated apparatus to assure wafer quality and manufacturability
摘要:
The present disclosure provides a system and method for processing a semiconductor substrate wherein a substrate is received at a load lock interface. The substrate is transferred from the load lock interface to a process module using a first module configured for unprocessed substrates. A manufacturing process is performed on the substrate within the process module. Thereafter, the substrate is transferred from the process module to the load lock interface using a second module configured for processed substrates.
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