发明授权
- 专利标题： Method of measuring interference
- 专利标题（中）： 测量干扰的方法
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申请号： US12921148申请日： 2009-03-05
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公开(公告)号： US08644865B2公开(公告)日： 2014-02-04
- 发明人: Jae Hoon Chung , Hyun Soo Ko , Moon Il Lee , Bin Chul Ihm
- 申请人： Jae Hoon Chung , Hyun Soo Ko , Moon Il Lee , Bin Chul Ihm
- 申请人地址： KR Seoul
- 专利权人： LG Electronics Inc.
- 当前专利权人： LG Electronics Inc.
- 当前专利权人地址： KR Seoul
- 代理机构： Lee, Hong, Degerman, Kang & Waimey
- 优先权： KR10-2008-0071821 20080723
- 国际申请： PCT/KR2009/001099 WO 20090305
- 国际公布： WO2009/110756 WO 20090911
- 主分类号： H04B15/00
- IPC分类号： H04B15/00 ; H04B7/00 ; H04B17/00
摘要：
A method of measuring interference to perform efficient data communication is disclosed. A method of measuring interference of neighboring cells comprises allocating one or more first resource elements, to which pilot signals are allocated, to predetermined symbol regions included in a first resource block; allocating one or more second resource elements for measuring interference of the neighboring cells to a first symbol region of the predetermined symbol regions; and measuring interference of the neighboring cells using the one or more second resource elements.
公开/授权文献
- US20110009137A1 METHOD OF MEASURING INTERFERENCE 公开/授权日：2011-01-13
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