Invention Grant
- Patent Title: Determining a position of a subarea of an object under examination and the structure thereof in a magnetic resonance system
- Patent Title (中): 确定被检查物体的子区域的位置及其在磁共振系统中的结构
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Application No.: US13015065Application Date: 2011-01-27
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Publication No.: US08648595B2Publication Date: 2014-02-11
- Inventor: Jan Ole Blumhagen , Matthias Fenchel , Ralf Ladebeck
- Applicant: Jan Ole Blumhagen , Matthias Fenchel , Ralf Ladebeck
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: DE102010006431 20100201
- Main IPC: G01V3/00
- IPC: G01V3/00

Abstract:
A method is disclosed for determining a location of a subarea of an area under examination in a magnetic resonance system. The subarea is arranged at the edge of a field-of-view of the magnetic resonance system. In at least one embodiment of the method, at least one slice position is determined for an MR image in which the B0 field at the edge of the MR image satisfies a homogeneity value. For the slice position determined an MR image is acquired which contains the subarea at the edge of the field-of-view and the location of the subarea of the object under examination is determined through the location of the subarea in the MR image.
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