发明授权
- 专利标题: Management of a non-volatile memory based on test quality
- 专利标题(中): 基于测试质量管理非易失性存储器
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申请号: US12730551申请日: 2010-03-24
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公开(公告)号: US08650446B2公开(公告)日: 2014-02-11
- 发明人: Matthew Byom , Nir J. Wakrat , Kenneth Herman , Daniel J. Post
- 申请人: Matthew Byom , Nir J. Wakrat , Kenneth Herman , Daniel J. Post
- 申请人地址: US CA Cupertino
- 专利权人: Apple Inc.
- 当前专利权人: Apple Inc.
- 当前专利权人地址: US CA Cupertino
- 代理机构: Van Court & Aldridge LLP
- 主分类号: G11C29/00
- IPC分类号: G11C29/00
摘要:
Systems and methods are disclosed for managing a non-volatile memory (“NVM”), such as a flash memory. The NVM may be managed based on results of a test performed on the NVM. The test may indicate, for example, physical memory locations that may be susceptible to errors, such as certain pages in the blocks of the NVM. Tests on multiple NVMs of the same type may be compiled to create a profile of error tendencies for that type of NVM. In some embodiments, data may be stored in the NVM based on individual test results for the NVM or based on a profile of the NVM type. For example, memory locations susceptible to error may be retired or data stored in those memory locations may be protected by a stronger error correcting code.
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