摘要:
Systems and methods are disclosed for managing a non-volatile memory (“NVM”), such as a flash memory. The NVM may be managed based on results of a test performed on the NVM. The test may indicate, for example, physical memory locations that may be susceptible to errors, such as certain pages in the blocks of the NVM. Tests on multiple NVMs of the same type may be compiled to create a profile of error tendencies for that type of NVM. In some embodiments, data may be stored in the NVM based on individual test results for the NVM or based on a profile of the NVM type. For example, memory locations susceptible to error may be retired or data stored in those memory locations may be protected by a stronger error correcting code.
摘要:
This can relate to handling a non-volatile memory (“NVM”) operating at a substantially full memory. The non-volatile memory can report its physical capacity to an NVM driver. The NVM driver can scale-up the physical capacity a particular number of times to generate a “scaled physical capacity,” which is then reported to the file system. Because the scaled physical capacity is greater than the NVM's actual physical capacity, the file system allocates a logical space to the NVM that is substantially greater than the NVM's capacity. This can cause less crowding of the logical block addresses within the logical space, thus making it easier for the file system to operate and improving system performance. A commitment budget can also be reported to the file system that corresponds to the NVM's physical capacity, and which can define the amount of data the file system can commit for storage in the NVM.
摘要:
Systems and methods are provided for handling errors during device bootup from a non-volatile memory (“NVM”). A NVM interface of an electronic device can be configured to detect errors and maintain an error log in volatile memory while the device is being booted up. Once device bootup has completed, a NVM driver of the electronic device can be configured to correct the detected errors using the error log. For example, the electronic device can move data to more reliable blocks and/or retire blocks that are close to failure, thereby improving overall device reliability.
摘要:
Systems and methods are provided for dynamically allocating a number of bits per cell to memory locations of a non-volatile memory (“NVM”) device. In some embodiments, a host may determine whether to store data in the NVM device using SLC programming or MLC programming operations. The host may allocate an erased block as an SLC block or MLC block based on this determination regardless of whether the erased block was previously used as an SLC block, MLC block, or both. In some embodiments, to dynamically allocate a memory location as SLC or MLC, the host may provide an address vector to the NVM package, where the address vector may specify the memory location and the number of bits per cell to use for that memory location.
摘要:
Stacked die having vertically-aligned conductors and methods for making the same are disclosed for providing a non-volatile memory, such as flash memory (e.g., NAND flash memory), for use in an electronic device.
摘要:
Systems, apparatuses, and methods are provided for detecting corrupted data for a system having non-volatile memory, such as NAND Flash memory. In some embodiments, a non-volatile memory (“NVM”) package is provided, which can include a NVM controller and one or more NVM dies. Each NVM die can include one or more blocks, where each block can further include an array of memory cells. One or more of these memory cells can be configured as “multi-level cells” (“MLCs”). In some embodiments, in order to avoid transmitting data obtained from an improperly programmed page of a MLC, a NVM controller can be configured to detect if data obtained from the page is in fact data stored in a different page.
摘要:
Systems and methods are disclosed for dynamically allocating power for a system having non-volatile memory. A power budgeting manager of a system can determine if the total amount of power available for the system is below a pre-determined power level (e.g., a low power state). While the system is operating in the low power state, the power budgeting manager can dynamically allocate power among various components of the system (e.g., a processor and non-volatile memory).
摘要:
Systems and methods are provided for testing a non-volatile memory, such as a flash memory. The non-volatile memory may be virtually partitioned into a test region and a general purpose region. A test application may be stored in the general purpose region, and the test application can be executed to run a test of the memory locations in the test region. The results of the test may be stored in the general purpose region. At the completion of the test, the test results may be provided from the general purpose region and displayed to a user. The virtual partitions may be removed prior to shipping the electronic device for distribution.
摘要:
Systems and methods are provided for unmapping unused logical addresses at mount-time of a file system. An electronic device, which includes a non-volatile memory (“NVM”), may implement a file system that, at mount-time of the NVM, identifies all of the logical addresses associated with the NVM that are unallocated. The file system may then pass this information on to a NVM manager, such as in one or more unmap requests. This can ensure that the NVM manager does not maintain data associated with a logical address that is no longer needed by the file system.
摘要:
Systems and methods are provided for testing a non-volatile memory, such as a flash memory. The non-volatile memory may be virtually partitioned into a test region and a general purpose region. A test application may be stored in the general purpose region, and the test application can be executed to run a test of the memory locations in the test region. The results of the test may be stored in the general purpose region. At the completion of the test, the test results may be provided from the general purpose region and displayed to a user. The virtual partitions may be removed prior to shipping the electronic device for distribution.