Invention Grant
US08652887B2 Multi-layer structures and process for fabricating semiconductor devices 有权
用于制造半导体器件的多层结构和工艺

Multi-layer structures and process for fabricating semiconductor devices
Abstract:
The present invention relates to a method for providing a Silicon-On-Insulator (SOI) stack that includes a substrate layer, a first oxide layer on the substrate layer and a silicon layer on the first oxide layer (BOX layer). The method includes providing at least one first region of the SOI stack wherein the silicon layer is thinned by thermally oxidizing a part of the silicon layer and providing at least one second region of the SOI stack wherein the first oxide layer (BOX layer) is thinned by annealing.
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