Invention Grant
- Patent Title: Methods and systems for detecting terahertz radiation by radiation enhanced emission of fluorescence
- Patent Title (中): 通过辐射增强荧光发射来检测太赫兹辐射的方法和系统
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Application No.: US13095267Application Date: 2011-04-27
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Publication No.: US08653462B2Publication Date: 2014-02-18
- Inventor: Xi-Cheng Zhang , Jingle Liu
- Applicant: Xi-Cheng Zhang , Jingle Liu
- Applicant Address: US NY Troy
- Assignee: Rensselaer Polytechnic Institute
- Current Assignee: Rensselaer Polytechnic Institute
- Current Assignee Address: US NY Troy
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Main IPC: G01J5/02
- IPC: G01J5/02

Abstract:
Methods and systems for detecting radiation, particularly, terahertz (THz) radiation, are disclosed. The methods and systems disclosed include directing an optical beam in a volume of gas; ionizing at least a portion of the volume of gas with the optical beam to produce a plasma; and detecting a fluorescence produced from an interaction of a radiation wave with the plasma. The information contained in the characteristics of the detected fluorescence, for example, the amplitude and/or phase are used to characterize the radiation wave. Aspects of the invention may be used for homeland security, medicine, and astronomy, among other fields.
Public/Granted literature
- US20110272584A1 METHODS AND SYSTEMS FOR DETECTING TERAHERTZ RADIATION BY RADIATION ENHANCED EMISSION OF FLUORESCENCE Public/Granted day:2011-11-10
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