Invention Grant
- Patent Title: Apparatus and method for measuring ion beam current
- Patent Title (中): 用于测量离子束电流的装置和方法
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Application No.: US12841833Application Date: 2010-07-22
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Publication No.: US08653807B2Publication Date: 2014-02-18
- Inventor: Peter M Kopalidis , Zhimin Wan
- Applicant: Peter M Kopalidis , Zhimin Wan
- Applicant Address: US CA San Jose
- Assignee: Advanced Ion Beam Technology, Inc.
- Current Assignee: Advanced Ion Beam Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Stout, Uxa, Buyan & Mullins, LLP
- Main IPC: G01N27/00
- IPC: G01N27/00 ; G01N27/62 ; H01J37/08 ; A61N5/00

Abstract:
Techniques for ion beam current measurement, especially for measuring low energy ion beam current, are disclosed. In one exemplary embodiment, the techniques may be realized as an ion beam current measurement apparatus has at least a planar Faraday cup and a magnet device. The planar Faraday cup is close to an inner surface of a chamber wall, and may be non-parallel to or parallel to the inner surface. The magnet device is located close to the planar Faraday cup. Therefore, by properly adjusting the magnetic field, secondary electrons, incoming electrons and low energy ions may be adequately suppressed. Further, the planar Faraday cup may surround an opening of an additional Faraday cup being any conventional Faraday cup. Therefore, the whole ion beam may be received and measured well by the larger cross-section area of at least the planar Faraday cup on the ion beam path.
Public/Granted literature
- US20120019257A1 APPARATUS AND METHOD FOR MEASURING ION BEAM CURRENT Public/Granted day:2012-01-26
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