发明授权
- 专利标题： Walk-through imaging system having vertical linear x-ray source
- 专利标题（中）： 具有垂直线性X射线源的直通成像系统
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申请号： US13171676申请日： 2011-06-29
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公开(公告)号： US08654919B2公开(公告)日： 2014-02-18
- 发明人: John Michael Sabol , Lawrence E. Murphy , Kadri Nizar Jabri , Anila Lingamneni , Scott William Robinson , David L. Widmann
- 申请人： John Michael Sabol , Lawrence E. Murphy , Kadri Nizar Jabri , Anila Lingamneni , Scott William Robinson , David L. Widmann
- 申请人地址： US NY Schenectady
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 当前专利权人地址： US NY Schenectady
- 代理机构： Ziolkowski Patent Solutions Group, SC
- 主分类号： A61B6/02
- IPC分类号： A61B6/02
摘要：
A system and method for acquiring x-ray imaging data from a subject is disclosed. The x-ray imaging system includes a first support structure oriented in a vertical fashion and a second support structure oriented in a vertical fashion and spaced apart from the first support structure to define a scanning area configured to receive a subject to be scanned. A linear x-ray source is affixed to the first support structure on one side of the scanning area and is oriented in a vertical fashion, with the linear x-ray source configured to emit x-rays towards the subject. A linear detector arrangement is affixed to the second support structure on another side of the scanning area and is generally opposite the linear x-ray source. The linear detector arrangement is configured to receive x-rays after passing through the subject.
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