Invention Grant
US08658498B1 Single mask spacer technique for semiconductor device features 有权
用于半导体器件特征的单掩模间隔技术

Single mask spacer technique for semiconductor device features
Abstract:
A method for fabricating vertical surround gate structures in semiconductor device arrays. The method includes forming pillars separated by vertical and horizontal trenches on a substrate. Forming a gate layer over the pillars and trenches such that the gate layer forms gate trenches in the horizontal trenches. The method includes forming fillers within the gate trenches, and planarizing the gate layer and fillers. The method also includes successively etching a first portion of the gate layer, removing the fillers, and etching a second portion of the gate layer.
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