Invention Grant
- Patent Title: Single mask spacer technique for semiconductor device features
- Patent Title (中): 用于半导体器件特征的单掩模间隔技术
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Application No.: US13969629Application Date: 2013-08-19
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Publication No.: US08658498B1Publication Date: 2014-02-25
- Inventor: Chung H. Lam , Jing Li
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Ido Tuchman; Louis J. Percello
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A method for fabricating vertical surround gate structures in semiconductor device arrays. The method includes forming pillars separated by vertical and horizontal trenches on a substrate. Forming a gate layer over the pillars and trenches such that the gate layer forms gate trenches in the horizontal trenches. The method includes forming fillers within the gate trenches, and planarizing the gate layer and fillers. The method also includes successively etching a first portion of the gate layer, removing the fillers, and etching a second portion of the gate layer.
Information query
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