Invention Grant
- Patent Title: Inspection system and method for fast changes of focus
- Patent Title (中): 检测系统和方法快速改变焦点
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Application No.: US13923086Application Date: 2013-06-20
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Publication No.: US08659754B2Publication Date: 2014-02-25
- Inventor: Haim Feldman , Boris Morgenstein , Roman Naidis , Adam Baer
- Applicant: Applied Materials Israel, Ltd.
- Applicant Address: IL Rehovot
- Assignee: Applied Materials Israel, Ltd.
- Current Assignee: Applied Materials Israel, Ltd.
- Current Assignee Address: IL Rehovot
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An inspection system includes a first focusing unit configured to perform fast focus changes to a first focusing function applied to an incident light beam. A traveling lens acousto-optic device is arranged to receive the light beam focused by the first focusing function and produce focused spots using a plurality of traveling lenses generated in response to radio frequency signals. The traveling lenses apply a second focusing function and the traveling lens acousto-optic device is arranged to alter the second focusing function at a fast rate. The inspection system also includes optics arranged to direct the focused spots onto an inspected object and to direct radiation from the inspected object to a sensor.
Public/Granted literature
- US20130342893A1 INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS Public/Granted day:2013-12-26
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