- 专利标题: Component presence/absence judging apparatus and method
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申请号: US13177020申请日: 2011-07-06
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公开(公告)号: US08660334B2公开(公告)日: 2014-02-25
- 发明人: Hiroshi Oike , Mitsutaka Inagaki
- 申请人: Hiroshi Oike , Mitsutaka Inagaki
- 申请人地址: JP Chiryu-shi
- 专利权人: Fuji Machine Mfg. Co., Ltd.
- 当前专利权人: Fuji Machine Mfg. Co., Ltd.
- 当前专利权人地址: JP Chiryu-shi
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2010-164133 20100721
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
A component presence/absence judging apparatus judges the presence/absence of components through a registration step and an inspection step. The registration step includes an ante-mounting feature acquisition step, a post-mounting feature acquisition step and a classifier configuration step. At the ante-mounting and post-mounting feature acquisition steps, ante-mounting features and post-mounting features are respectively acquired from an ante-mounting image and a post-mounting image taken at each of predetermined places on an ante-mounting board and a post-mounting board. At the classifier configuration step, a classifier is configured by registering the ante-mounting features and the post-mounting features as training data to a support vector machine. Then, at the inspection step, the presence/absence of a component at each of the predetermined places on each post-mounting operation board to be inspected is judged by inputting post-mounting operation features acquired from each of the predetermined places on each post-mounting operation board to the support vector machine configured as the classifier.
公开/授权文献
- US08699782B2 Component presence/absence judging apparatus and method 公开/授权日:2014-04-15
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