发明授权
- 专利标题: Nondestructive testing system
- 专利标题(中): 无损检测系统
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申请号: US12952487申请日: 2010-11-23
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公开(公告)号: US08661170B2公开(公告)日: 2014-02-25
- 发明人: Saichi Sato
- 申请人: Saichi Sato
- 申请人地址: JP Tokyo
- 专利权人: Olympus Corporation
- 当前专利权人: Olympus Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Holtz, Holtz, Goodman & Chick
- 主分类号: G06F13/12
- IPC分类号: G06F13/12 ; G06F13/38 ; G06F1/24 ; G06F9/00
摘要:
A nondestructive testing apparatus includes a storage section which stores a plurality of predetermined functions which are executable by the nondestructive testing apparatus, each of the predetermined functions being initially set to one of a permitted state and a disabled state; an input section which includes a plurality of input portions respectively corresponding to the predetermined functions; and a control section which is adapted to receive permission information including information which unlocks at least one of the predetermined functions initially set in the disabled state so as to be set to the permitted state. The control section automatically assigns the at least one predetermined function which has been unlocked to the corresponding input portion of the input section.
公开/授权文献
- US20120131325A1 NONDESTRUCTIVE TESTING SYSTEM 公开/授权日:2012-05-24
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