发明授权
US08665125B2 Electronic device and method for measuring differential non-linearity (DNL) of an SAR ADC
有权
用于测量SAR ADC的差分非线性(DNL)的电子设备和方法
- 专利标题: Electronic device and method for measuring differential non-linearity (DNL) of an SAR ADC
- 专利标题(中): 用于测量SAR ADC的差分非线性(DNL)的电子设备和方法
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申请号: US13569310申请日: 2012-08-08
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公开(公告)号: US08665125B2公开(公告)日: 2014-03-04
- 发明人: Michael Reinhold , Martin Allinger , Frank Ohnhaeuser
- 申请人: Michael Reinhold , Martin Allinger , Frank Ohnhaeuser
- 申请人地址: DE Freising
- 专利权人: Texas Instruments Deutschland GmbH
- 当前专利权人: Texas Instruments Deutschland GmbH
- 当前专利权人地址: DE Freising
- 代理商 Alan A. R. Cooper; W. James Brady, III; Frederick J. Telecky, Jr.
- 优先权: DE102011110115 20110815
- 主分类号: H03M1/10
- IPC分类号: H03M1/10
摘要:
The device comprises a successive approximation register, a capacitive digital-to-analog converter comprising a plurality of capacitors, the plurality of capacitors being coupled with a first side to a common node; a comparator coupled to the common node and being adapted to make bit decisions by comparing a voltage at the common node with another voltage level, and a SAR control stage for providing a digital code representing a conversion result. The device is configured to operate in a calibration mode, where the device is configured to sample a reference voltage on a first capacitor of the plurality of capacitors by coupling one side of the first capacitor to the reference voltage, to perform a regular conversion cycle with at least those capacitors of the plurality of capacitors having lower significance than the first capacitor and to provide the conversion result of the regular conversion cycle for calibrating the first capacitor.
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