A method of controlling a quantity of non-process of record (POR) process limiting yield (PLY) inspections in wafer processing includes setting aside planned capacity for non-POR work, upon receipt of a request for non-POR work, estimating a time required for completion of the request and comparing the estimated time against a remainder of the set aside planned capacity, approving the request in an event the comparison indicates that the estimated time is available in the set aside planned capacity and rejecting the request in an event the comparison indicates that the estimated time is not available in the set aside planned capacity.