发明授权
- 专利标题: Package-on-package structures with reduced bump bridging
- 专利标题(中): 封装封装结构,减少桥接桥接
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申请号: US12843549申请日: 2010-07-26
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公开(公告)号: US08669651B2公开(公告)日: 2014-03-11
- 发明人: Chung-Ying Yang , Chao-Wen Shih , Hao-Yi Tsai , Hsien-Wei Chen , Mirng-Ji Lii , Tzuan-Horng Liu
- 申请人: Chung-Ying Yang , Chao-Wen Shih , Hao-Yi Tsai , Hsien-Wei Chen , Mirng-Ji Lii , Tzuan-Horng Liu
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: H01L23/538
- IPC分类号: H01L23/538
摘要:
A device includes a package substrate including a first non-reflowable metal bump extending over a top surface of the package substrate; a die over and bonded to the package substrate; and a package component over the die and bonded to the package substrate. The package component includes a second non-reflowable metal bump extending below a bottom surface of the package component. The package component is selected from the group consisting essentially of a device die, an additional package substrate, and combinations thereof. A solder bump bonds the first non-reflowable metal bump to the second non-reflowable metal bump.
公开/授权文献
- US20120018877A1 Package-on-Package Structures with Reduced Bump Bridging 公开/授权日:2012-01-26
信息查询
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