Invention Grant
- Patent Title: Measuring quality of experience associated with a mobile device
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Application No.: US13579248Application Date: 2012-03-08
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Publication No.: US08670723B2Publication Date: 2014-03-11
- Inventor: Wei Yeu Phan , Tralvex Yeap
- Applicant: Wei Yeu Phan , Tralvex Yeap
- Applicant Address: US DE Wilmington
- Assignee: Empire Technology Development LLC
- Current Assignee: Empire Technology Development LLC
- Current Assignee Address: US DE Wilmington
- Agency: Brundidge & Stranger, P.C.
- International Application: PCT/US2012/028332 WO 20120308
- International Announcement: WO2013/133841 WO 20130912
- Main IPC: H04B17/00
- IPC: H04B17/00
Abstract:
Implementations and techniques for measuring quality of experience associated with a mobile device are generally disclosed.
Public/Granted literature
- US20130237157A1 MEASURING QUALITY OF EXPERIENCE ASSOCIATED WITH A MOBILE DEVICE Public/Granted day:2013-09-12
Information query
