发明授权
US08670948B2 Numerical aperture integration for optical critical dimension (OCD) metrology
失效
光学关键尺寸(OCD)计量的数值孔径积分
- 专利标题: Numerical aperture integration for optical critical dimension (OCD) metrology
- 专利标题(中): 光学关键尺寸(OCD)计量的数值孔径积分
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申请号: US13656487申请日: 2012-10-19
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公开(公告)号: US08670948B2公开(公告)日: 2014-03-11
- 发明人: Hanyou Chu , Peilin Jiang
- 申请人: Hanyou Chu , Peilin Jiang
- 申请人地址: JP Tokyo US CA Milpitas
- 专利权人: Tokyo Electron Limited,KLA-Tencor Corporation
- 当前专利权人: Tokyo Electron Limited,KLA-Tencor Corporation
- 当前专利权人地址: JP Tokyo US CA Milpitas
- 代理机构: Blakely Sokoloff Taylor & Zafman LLP
- 主分类号: G01N37/00
- IPC分类号: G01N37/00
摘要:
Provided are techniques for numerically integrating an intensity distribution function over a numerical aperture in a manner dependent on a determination of whether the numerical aperture spans a Rayleigh singularity. Where a singularity exists, Gaussian quadrature (cubature) is performed using a set of weights and points (nodes) that account for the effect of the Wood anomaly present within the aperture space. The numerical aperture may be divided into subregions separated by curves where the Wood anomaly condition is satisfied. Each subregion is then numerically integrated and a weighted sum of the subregion contributions is the estimate of the integral. Alternatively, generalized Gaussian quadrature (cubature) is performed where an analytical polynomial function which accounts for the effect of the Wood anomaly present within the aperture space is integrated. Points and nodes generated from a fit of the analytical polynomial function are then used for integration of the intensity distribution function.
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