Invention Grant
- Patent Title: Tungsten film forming method
- Patent Title (中): 钨膜成型方法
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Application No.: US13684389Application Date: 2012-11-23
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Publication No.: US08673778B2Publication Date: 2014-03-18
- Inventor: Kohichi Satoh
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-258117 20111125; JP2012-051018 20120307; JP2012-183934 20120823
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
A tungsten film forming method for forming a tungsten film on a surface of a substrate while heating the substrate in a depressurized atmosphere in a processing chamber includes forming an initial tungsten film for tungsten nucleation on the surface of the substrate by alternately repeating a supply of WF6 gas which is raw material of tungsten and a supply of H2 gas which is a reducing gas in the processing chamber while performing a purge in the processing chamber between the supplies of the WF6 gas and the H2 gas and adsorbing a gas containing a material for nucleation onto a surface of the initial tungsten film. The film forming method further includes depositing a crystallinity blocking tungsten film for blocking crystallinity of the initial tungsten film by supplying the WF6 gas and the H2 gas into the processing chamber.
Public/Granted literature
- US20130137262A1 TUNGSTEN FILM FORMING METHOD Public/Granted day:2013-05-30
Information query
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