Invention Grant
- Patent Title: Semiconductor structure having vias and high density capacitors
- Patent Title (中): 具有通孔和高密度电容器的半导体结构
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Application No.: US13302168Application Date: 2011-11-22
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Publication No.: US08674423B2Publication Date: 2014-03-18
- Inventor: David S. Collins , Kai D. Feng , Zhong-Xiang He , Peter J. Lindgren , Robert M. Rassel
- Applicant: David S. Collins , Kai D. Feng , Zhong-Xiang He , Peter J. Lindgren , Robert M. Rassel
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Anthony Canale
- Main IPC: H01L27/108
- IPC: H01L27/108

Abstract:
A method of making a semiconductor structure includes forming at least a first trench and a second trench having different depths in a substrate, forming a capacitor in the first trench, and forming a via in the second trench. A semiconductor structure includes a capacitor arranged in a first trench formed in a substrate and a via arranged in a second trench formed in the substrate. The first and second trenches have different depths in the substrate.
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