Invention Grant
- Patent Title: Edge density detection
- Patent Title (中): 边缘密度检测
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Application No.: US13830590Application Date: 2013-03-14
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Publication No.: US08674732B1Publication Date: 2014-03-18
- Inventor: Wayne Fang
- Applicant: Xilinx, Inc.
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent W. Eric Webostad
- Main IPC: H03L7/06
- IPC: H03L7/06
Abstract:
An edge density detector is disclosed. This edge density detector is to receive a reference frequency signal and a feedback frequency signal. This edge density detector includes a first pulse generator, a second pulse generator, and a charge pump. The first pulse generator is coupled to receive the reference frequency signal and is configured to generate a first pulse signal. The second pulse generator is coupled to receive the feedback frequency signal and is configured to generate a second pulse signal. The charge pump is coupled to receive the first pulse signal and the second pulse signal to provide a control voltage signal. The control voltage signal is a phase independent with respect to the reference frequency signal and the feedback frequency signal.
Information query
