发明授权
US08676536B2 Method and apparatus for selecting voltage and frequency levels for use in at-speed testing
失效
用于选择用于速度测试的电压和频率电平的方法和装置
- 专利标题： Method and apparatus for selecting voltage and frequency levels for use in at-speed testing
- 专利标题（中）： 用于选择用于速度测试的电压和频率电平的方法和装置
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申请号： US12696902申请日： 2010-01-29
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公开(公告)号： US08676536B2公开(公告)日： 2014-03-18
- 发明人: Jose M Martinez , Chandramouli Visweswariah , Francis Woytowich , Jinjun Xiong
- 申请人： Jose M Martinez , Chandramouli Visweswariah , Francis Woytowich , Jinjun Xiong
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理商 Preston Young
- 主分类号： G06F17/18
- IPC分类号： G06F17/18 ; G01R31/00
摘要：
In one embodiment, the invention is a method and apparatus for selecting voltage and frequency levels for use in at-speed testing. One embodiment of a method for selecting a set of test conditions with which to test an integrated circuit chip includes formulating a statistical optimization problem and obtaining a solution to the statistical optimization problem, where the solution is the set of test conditions.
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