Invention Grant
- Patent Title: Determining the resonance parameters for mechanical oscillators
- Patent Title (中): 确定机械振荡器的谐振参数
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Application No.: US12792500Application Date: 2010-06-02
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Publication No.: US08676543B2Publication Date: 2014-03-18
- Inventor: H. Alan Wolf , Chung-Min Cheng , George Akehurst , Dalia G. Yablon , Alan M. Schilowitz , Manuel S. Alvarez
- Applicant: H. Alan Wolf , Chung-Min Cheng , Dalia G. Yablon , Alan M. Schilowitz , Manuel S. Alvarez , Yvonne Mathez
- Applicant Address: US NJ Annandale
- Assignee: ExxonMobil Research and Engineering Company
- Current Assignee: ExxonMobil Research and Engineering Company
- Current Assignee Address: US NJ Annandale
- Agent Ronald D. Hantman
- Main IPC: H04B15/00
- IPC: H04B15/00

Abstract:
Mechanical oscillators employ the use of resonance parameters, frequency and the quality factor Q, for the measurement of corrosion or deposition. The ability of a mechanical oscillator to measure small amounts of metal loss or deposition is not only dependent upon the mechanical design but is limited by the precision in determining the resonance frequency and Q. Methods for measuring these resonance parameters with a high precision in the presence of noise are provided. The increased degree of precision improves the utility of these devices as sensitive probes for corrosion and deposition (fouling) measurement. The increased degree of precision is enabled in part by employing curve fitting consistent with modeling the mechanical oscillator as a simple harmonic oscillator. This curve fitting procedure, combined with averaging and utilizing signal processing parameters to mitigate noise effects, adds precision in measuring resonance parameters.
Public/Granted literature
- US20100324852A1 DETERMINING THE RESONANCE PARAMETERS FOR MECHANICAL OSCILLATORS Public/Granted day:2010-12-23
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