发明授权
US08683308B2 Semiconductor device, information processing apparatus, and method of detecting error 有权
半导体装置,信息处理装置及误差检测方法

Semiconductor device, information processing apparatus, and method of detecting error
摘要:
Each of (n−1) 2-bit checking units, where n is an integer larger than or equal to 4, receives n-bit redundant encoded data generated from 1-bit input data, and outputs 2-bit check data based on a result of comparison between bits of the encoded data, combinations of the bits differing in each comparison. An all-bit checking unit outputs all-bit check data based on exclusive ORs of all-bit of the encoded data. An error detecting unit detects errors in the encoded data on the basis of the (n−1) sets of 2-bit check data and the all-bit check data, and outputs the input data on the basis of the result of error detection.
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