发明授权
- 专利标题: Semiconductor device, information processing apparatus, and method of detecting error
- 专利标题(中): 半导体装置,信息处理装置及误差检测方法
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申请号: US13404669申请日: 2012-02-24
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公开(公告)号: US08683308B2公开(公告)日: 2014-03-25
- 发明人: Nina Tsukamoto , Toshihiro Tomozaki , Terumasa Haneda
- 申请人: Nina Tsukamoto , Toshihiro Tomozaki , Terumasa Haneda
- 申请人地址: JP Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JP Kawasaki
- 代理机构: Fujitsu Patent Center
- 优先权: JP2011-101887 20110428
- 主分类号: G06F11/00
- IPC分类号: G06F11/00 ; G08C25/00 ; H03M13/00 ; H04L1/00
摘要:
Each of (n−1) 2-bit checking units, where n is an integer larger than or equal to 4, receives n-bit redundant encoded data generated from 1-bit input data, and outputs 2-bit check data based on a result of comparison between bits of the encoded data, combinations of the bits differing in each comparison. An all-bit checking unit outputs all-bit check data based on exclusive ORs of all-bit of the encoded data. An error detecting unit detects errors in the encoded data on the basis of the (n−1) sets of 2-bit check data and the all-bit check data, and outputs the input data on the basis of the result of error detection.
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