Invention Grant
- Patent Title: Method for the identification of the clonal source of a restriction fragment
- Patent Title (中): 用于鉴定限制性片段的克隆源的方法
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Application No.: US13783601Application Date: 2013-03-04
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Publication No.: US08685650B2Publication Date: 2014-04-01
- Inventor: Michael Josephus Theresia Van Eijk , Taco Peter Jesse
- Applicant: Keygene N.V.
- Applicant Address: NL Wageningen
- Assignee: Keygene N.V.
- Current Assignee: Keygene N.V.
- Current Assignee Address: NL Wageningen
- Agency: Foley & Lardner LLP
- Agent Richard C. Peet
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C12P19/34

Abstract:
The present invention relates to a high throughput method for the identification and detection of molecular markers wherein restriction fragments are generated and suitable adaptors comprising (sample-specific) identifiers are ligated. The adapter-ligated restriction fragments may be selectively amplified with adaptor compatible primers carrying selective nucleotides at their 3′ end. The amplified adapter-ligated restriction fragments are, at least partly, sequenced using high throughput sequencing methods and the sequence parts of the restriction fragments together with the sample-specific identifiers serve as molecular markers.
Public/Granted literature
- US20130184166A1 METHOD FOR THE IDENTIFICATION OF THE CLONAL SOURCE OF A RESTRICTION FRAGMENT Public/Granted day:2013-07-18
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