Invention Grant
- Patent Title: Thermal interface material, test structure and method of use
- Patent Title (中): 热界面材料,试验结构及使用方法
-
Application No.: US12770948Application Date: 2010-04-30
-
Publication No.: US08686749B2Publication Date: 2014-04-01
- Inventor: Brian M. Erwin , David L. Gardell , James N. Humenik , Rajneesh Kumar , John Lawson
- Applicant: Brian M. Erwin , David L. Gardell , James N. Humenik , Rajneesh Kumar , John Lawson
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Steven Meyers
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
Non-corrosive thermal interface materials for use in a test structure and method of use. The test structure includes a heat sink for dissipating heat away from a device under test. The test structure further includes a non-corrosive thermal interface material disposed between the heat sink and the device under test. The non-corrosive thermal interface material is capable of withstanding test conditions for at least 60 minutes for at least 115° C. without staining or leaving residue on the device under test after baking.
Public/Granted literature
- US20110267084A1 THERMAL INTERFACE MATERIAL, TEST STRUCTURE AND METHOD OF USE Public/Granted day:2011-11-03
Information query