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US08686749B2 Thermal interface material, test structure and method of use 有权
热界面材料,试验结构及使用方法

Thermal interface material, test structure and method of use
Abstract:
Non-corrosive thermal interface materials for use in a test structure and method of use. The test structure includes a heat sink for dissipating heat away from a device under test. The test structure further includes a non-corrosive thermal interface material disposed between the heat sink and the device under test. The non-corrosive thermal interface material is capable of withstanding test conditions for at least 60 minutes for at least 115° C. without staining or leaving residue on the device under test after baking.
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