Invention Grant
US08687180B2 System, method, and device for determining a focal position of an objective in a microscopy imaging system
有权
用于确定显微镜成像系统中的物镜的焦点位置的系统，方法和装置
- Patent Title: System, method, and device for determining a focal position of an objective in a microscopy imaging system
- Patent Title (中): 用于确定显微镜成像系统中的物镜的焦点位置的系统，方法和装置
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Application No.: US13491017Application Date: 2012-06-07
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Publication No.: US08687180B2Publication Date: 2014-04-01
- Inventor: Avrum I. Cohen
- Applicant: Avrum I. Cohen
- Applicant Address: US CA Sunnyvale
- Assignee: Molecular Devices, LLC
- Current Assignee: Molecular Devices, LLC
- Current Assignee Address: US CA Sunnyvale
- Agent Bella Fishman
- Main IPC: G01B9/00
- IPC: G01B9/00 ; G01M11/02
Abstract:
A system and method of determining a focal position for an objective positioned at a measurement location of a sample holder in a microscopy imaging system are provided. The objective is moved to a position relative to the sample holder that corresponds to a distance between the objective and the sample holder. The sample holder has a conditioned upper surface. A focusing light beam is projected onto the sample holder when the objective is located at the position, and the objective focuses the focusing light beam on the sample holder. A reflected light beam resulting from reflection of the focusing light beam off the conditioned upper surface is observed. The focal position for the objective is determined based on the reflected light beam such that the objective produces an in focus image of a microscopy sample when the objective is located at the focal position.
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