Invention Grant
- Patent Title: Oversampling storage system captured waveform
- Patent Title (中): 超采样存储系统捕获的波形
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Application No.: US13788253Application Date: 2013-03-07
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Publication No.: US08693121B1Publication Date: 2014-04-08
- Inventor: Bruce W. McNeill , Jason D. Byrne
- Applicant: LSI Corporation
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Advent, LLP
- Main IPC: G11B5/09
- IPC: G11B5/09

Abstract:
A method includes designating a first sampling phase for a signal captured from a magnetic storage medium, where the signal is representative of information stored by the magnetic storage medium. The method further includes capturing a first waveform associated with the signal at the first sampling phase. The method also includes designating a second sampling phase different from the first sampling phase for the signal. The method further includes capturing a second waveform associated with the signal at the second sampling phase. The method also includes interleaving the first waveform and the second waveform to form an oversampled waveform. The first waveform and the second waveform are captured at a rate at least substantially equal to a rate at which the information stored by the magnetic storage medium was written to the magnetic storage medium.
Information query
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