Invention Grant
- Patent Title: Method and apparatus for generating and analyzing ions
- Patent Title (中): 用于产生和分析离子的方法和装置
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Application No.: US13634190Application Date: 2011-04-22
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Publication No.: US08704170B2Publication Date: 2014-04-22
- Inventor: Sumio Kumashiro , Wenjian Sun , Li Ding
- Applicant: Sumio Kumashiro , Wenjian Sun , Li Ding
- Applicant Address: CN Shanghai
- Assignee: Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Current Assignee: Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Current Assignee Address: CN Shanghai
- Agency: Morris Manning & Martin LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: CN201010165176 20100422
- International Application: PCT/CN2011/073156 WO 20110422
- International Announcement: WO2011/131142 WO 20111027
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/10 ; H01J49/24 ; H01J49/16

Abstract:
The current invention involves a method and a device for generating and analyzing ions in order to analyze samples directly without sample preparation. The gaseous neutral molecules are desorbed under atmospheric pressure by a desorption method. The desorbed neutral molecules are then transferred into a low pressure region where they are post-ionized by a mist from an electrospray probe tip or by photons from a vacuum UV source. The generated ions are then focused in a time varying electric field in the low pressure chamber before they are transferred into a mass spectrometer or ion mobility spectrometer for further analysis.
Public/Granted literature
- US20130026359A1 METHOD AND APPARATUS FOR GENERATING AND ANALYZING IONS Public/Granted day:2013-01-31
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