发明授权
- 专利标题： Technique for providing loopback testing with single stage equalizer
- 专利标题（中）： 提供单级均衡器的环回测试技术
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申请号： US13288701申请日： 2011-11-03
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公开(公告)号： US08705605B1公开(公告)日： 2014-04-22
- 发明人: Sangeeta Raman , Tim Tri Hoang
- 申请人： Sangeeta Raman , Tim Tri Hoang
- 申请人地址： US CA San Jose
- 专利权人： Altera Corporation
- 当前专利权人： Altera Corporation
- 当前专利权人地址： US CA San Jose
- 代理机构： Fletcher Yoder, P.C.
- 主分类号： H03K5/159
- IPC分类号： H03K5/159 ; H03H7/30 ; H03H7/40
摘要：
Devices and methods for serial loopback testing in an integrated circuit (IC) are provided. To implement loopback testing, an equalizer stage of a receiver of the IC is powered down. In addition, the common-mode voltage of the equalizer stage is reduced and/or a bulk node of the equalizer stage is connected to ground. Doing so may reduce the impact of capacitive coupling from the input pins of buffer, thereby improving the quality of the loopback output signal.
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