Invention Grant
- Patent Title: Technique for providing loopback testing with single stage equalizer
- Patent Title (中): 提供单级均衡器的环回测试技术
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Application No.: US13288701Application Date: 2011-11-03
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Publication No.: US08705605B1Publication Date: 2014-04-22
- Inventor: Sangeeta Raman , Tim Tri Hoang
- Applicant: Sangeeta Raman , Tim Tri Hoang
- Applicant Address: US CA San Jose
- Assignee: Altera Corporation
- Current Assignee: Altera Corporation
- Current Assignee Address: US CA San Jose
- Agency: Fletcher Yoder, P.C.
- Main IPC: H03K5/159
- IPC: H03K5/159 ; H03H7/30 ; H03H7/40
Abstract:
Devices and methods for serial loopback testing in an integrated circuit (IC) are provided. To implement loopback testing, an equalizer stage of a receiver of the IC is powered down. In addition, the common-mode voltage of the equalizer stage is reduced and/or a bulk node of the equalizer stage is connected to ground. Doing so may reduce the impact of capacitive coupling from the input pins of buffer, thereby improving the quality of the loopback output signal.
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