Invention Grant
- Patent Title: Methods and apparatus for calibrating flow controllers in substrate processing systems
- Patent Title (中): 校准基板处理系统中流量控制器的方法和装置
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Application No.: US12915345Application Date: 2010-10-29
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Publication No.: US08707754B2Publication Date: 2014-04-29
- Inventor: James P. Cruse , John W. Lane , Mariusch Gregor , Duc Buckius , Berrin Daran , Corie Lynn Cobb , Ming Xu , Andrew Nguyen
- Applicant: James P. Cruse , John W. Lane , Mariusch Gregor , Duc Buckius , Berrin Daran , Corie Lynn Cobb , Ming Xu , Andrew Nguyen
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Moser Taboada
- Agent Alan Taboada
- Main IPC: G01F25/00
- IPC: G01F25/00 ; H01L21/66 ; F16K37/00 ; H01L21/67 ; H01L21/306 ; H01L21/36

Abstract:
Methods and apparatus for calibrating a plurality of gas flows in a substrate processing system are provided herein. In some embodiments, a substrate processing system may include a cluster tool comprising a first process chamber and a second process chamber coupled to a central vacuum transfer chamber; a first flow controller to provide a process gas to the first process chamber; a second flow controller to provide the process gas to the second process chamber; a mass flow verifier to verify a flow rate from each of the first and second flow controllers; a first conduit to selectively couple the first flow controller to the mass flow verifier; and a second conduit to selectively couple the second flow controller to the mass flow verifier.
Public/Granted literature
- US20110265549A1 METHODS AND APPARATUS FOR CALIBRATING FLOW CONTROLLERS IN SUBSTRATE PROCESSING SYSTEMS Public/Granted day:2011-11-03
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