Invention Grant
- Patent Title: Mass spectrometry method
- Patent Title (中): 质谱法
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Application No.: US13527619Application Date: 2012-06-20
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Publication No.: US08710430B2Publication Date: 2014-04-29
- Inventor: Masuyuki Sugiyama , Yuichiro Hashimoto , Shun Kumano , Yohei Kawaguchi , Hidetoshi Morokuma
- Applicant: Masuyuki Sugiyama , Yuichiro Hashimoto , Shun Kumano , Yohei Kawaguchi , Hidetoshi Morokuma
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2011-140089 20110624
- Main IPC: H01J49/42
- IPC: H01J49/42 ; H01J49/26 ; H01J49/00
Abstract:
A mass spectrometry method that corrects the effects from space charge and that achieves both sensitivity and a dynamic range. The mass axis of the mass spectrum is corrected based on the counts of ions accumulated within the ion trap at the point in time each ion was extracted.
Public/Granted literature
- US20120326027A1 MASS SPECTROMETRY METHOD Public/Granted day:2012-12-27
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